The relationship between microstructure and dislocation density distribution in multicrystalline silicon

Journal of Applied Physics

Volumn 108, Issue 8, 2010, Pages

  Würzner, Sindy ^a   Helbig, Reń ^a   Funke, Claudia ^a   Möller, Hans Joachim ^a  

^a TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH PROCESS; DISLOCATION DENSITIES; ELECTRON BACKSCATTER DIFFRACTION TECHNIQUE; GRAIN ORIENTATION; GRAIN STRUCTURES; MULTI-CRYSTALLINE SILICON; SINGLE GRAINS; SLIP PLANE;

CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTALLIZATION; GRAIN BOUNDARIES; GRAIN GROWTH; MICROSTRUCTURE; POLYSILICON;

DISLOCATIONS (CRYSTALS);

EID: 78149438767     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3488643     Document Type: Article

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