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Physical Chemistry Chemical Physics

Volumn 13, Issue 38, 2011, Pages 17084-17092

Photoinduced hole trapping in single semiconductor quantum dots at specific sites at silicon oxide interfaces

(3) Krasselt, Cornelius a Schuster, Jörg a,b Von Borczyskowski, Christian a

a CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

b FRAUNHOFER INSTITUTE FOR ELECTRONIC NANO SYSTEMS ENAS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80053255995 PISSN: 14639076 EISSN: None Source Type: Journal
DOI: 10.1039/c1cp22040c Document Type: Article

Times cited : (37)

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