Combined Jonker and Ioffe analysis of oxide conductors and semiconductors

Journal of the American Ceramic Society

Volumn 94, Issue 1, 2011, Pages 187-193

  Zhu, Qimin ^a,b   Hopper, E Mitchell ^a   Ingram, Brian J ^c   Mason, Thomas O ^a,b  

^a Northwestern University   (United States)

^b Argonne Northwestern Solar Energy Research Center (ANSER)   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY OF STATE; ELECTRICAL CONDUCTIVITY; OXIDE SEMICONDUCTOR; POLYCRYSTALLINE CERAMICS; POWER FACTORS; SCREENING TOOL; THERMOELECTRIC MATERIAL; THERMOELECTRIC OXIDES; TRANSPARENT CONDUCTING OXIDE; TRANSPARENT CONDUCTORS;

ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; THERMOELECTRICITY;

POLYCRYSTALLINE MATERIALS;

EID: 80053129007     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2010.04047.x     Document Type: Article

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