Dependence of the chromatic aberration spot size on the form of the energy distribution of the charged particles

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 427, Issue 1-2, 1999, Pages 86-90

  Barth, J E ^a   Nykerk, M D ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CHARGED PARTICLES; COMPUTER SIMULATION; ELECTRON ENERGY LEVELS; MATHEMATICAL MODELS; PROBES;

CHROMATIC ABERRATION; ENERGY DISTRIBUTION; GAUSSIAN DISTRIBUTION; ION OPTICS; LORENTZIAN DISTRIBUTION;

ELECTRON OPTICS;

EID: 0344240234     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01531-9     Document Type: Article

References (5)

1. Barth J.E., Kruit P. Optik. 101:1996;101.
2. Egerton R.F. Inst. Phys. Conf. Ser. 153:1997;149.
3. Kruit P., Jansen G.H. Orloff J. Handbook of Charged Particle Optics. 1997;275 CRC Press, New York.
4. Mook H.W. High brightness electron source monochromator for electron microscopy. Nucl. Instr. and Meth. A. 427:1999;109.
5. Jansen G.H. Coulomb interactions in particle beams, Adv. Electron. Electron Phys. Suppl. 21. 1990;Academic Press, New York.