Evaluation of roughness parameters using image analysis from different optical and electronic microscopes;Evaluación de parámetros de rugosidad usando análisis de imágenes de diferentes microscopios ópticos y electrónicos

Informacion Tecnologica

Volumn 22, Issue 4, 2011, Pages 129-146

  Alves, Marcelo L ^a   Ferreira, Bruno B ^b   Leta, Fabiana R ^c  

^a INSTITUTO NACIONAL DE METROLOGIA   (Brazil)

^b FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^c FLUMINENSE FEDERAL UNIVERSITY   (Brazil)

Author keywords

Neural networks; Pattern recognition; Roughness; Textural descriptors

Indexed keywords

PATTERN RECOGNITION; QUALITY CONTROL;

CO-OCCURRENCE; DESCRIPTORS; ELECTRONIC MICROSCOPES; HARALICK; IMAGE-ANALYSIS; NEURAL-NETWORKS; OPTICAL MICROSCOPES; ROUGHNESS PARAMETERS; SURFACE CHARACTERISTICS; TEXTURAL DESCRIPTOR;

NEURAL NETWORKS;

EID: 80052948242     PISSN: 07168756     EISSN: 07180764     Source Type: Journal    
DOI: 10.4067/s0718-07642011000400014     Document Type: Article

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