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Volumn 110, Issue 5, 2011, Pages

Local structure analysis of boron-doped graphite by soft x-ray emission and absorption spectroscopy using synchrotron radiation

(8) Hanafusa, Atsushi a Muramatsu, Yasuji a Kaburagi, Yutaka b Yoshida, Akira b Hishiyama, Yoshihiro b Yang, Wanli c Denlinger, Jonathan D c Gullikson, Eric M c

a UNIVERSITY OF HYOGO (Japan)

b TOKYO CITY UNIVERSITY (Japan)

c LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON ATOM; BORON-DOPED; CARBON ATOMS; HEXAGONAL RINGS; HIGHLY ORIENTED GRAPHITE; LOCAL STRUCTURE; MOLECULAR ORBITAL METHOD; SOFT X-RAY EMISSIONS; SPECTRAL DIFFERENCES; SPECTRAL PROFILE; X-RAY EMISSION SPECTRA;

BORON; CHEMISORPTION; ELECTROMAGNETIC WAVE EMISSION; EMISSION SPECTROSCOPY; GRAPHITE; ION BEAMS; MOLECULAR ORBITALS; SYNCHROTRON RADIATION; SYNCHROTRONS; X RAY SCATTERING;

SPECTRUM ANALYSIS;

EID: 80052933673 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3631108 Document Type: Conference Paper

Times cited : (16)

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