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Volumn 59, Issue 6, 2010, Pages 455-461

Total electron yield ratios between sample components in total-electron-yield soft X-ray absorption spectroscopy

Author keywords

Soft X ray; Synchrotron radiation; Total electron yield; X ray absorption

Indexed keywords


EID: 77954560567     PISSN: 05251931     EISSN: None     Source Type: Journal    
DOI: 10.2116/bunsekikagaku.59.455     Document Type: Article
Times cited : (2)

References (10)
  • 1
    • 0004237782 scopus 로고
    • (Springer-Verlag, Berlin Heidelberg)
    • J. Shor: "NEXAFS Spectroscopy" (1992), (Springer-Verlag, Berlin Heidelberg).
    • (1992) NEXAFS Spectroscopy
    • Shor, J.1
  • 2
    • 77954551965 scopus 로고    scopus 로고
    • X [Japanese source]
    • E. M. Gullikson : X 38, 273 (2007)
    • (2007) , vol.38 , pp. 273
    • Gullikson, E.M.1
  • 3
    • 77954545631 scopus 로고    scopus 로고
    • X [Japanese source]
    • E. M. Gullikson : X 39, 105 (2008)
    • (2008) , vol.39 , pp. 105
    • Gullikson, E.M.1
  • 4
    • 77954557964 scopus 로고    scopus 로고
    • X [Japanese source]
    • E. M. Gullikson : X 40, 317 (2009).
    • (2009) , vol.40 , pp. 317
    • Gullikson, E.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.