Electronic properties of hydrogen storage materials with photon-in/photon-out soft-X-ray spectroscopy

Journal of Physics and Chemistry of Solids

Volumn 69, Issue 9, 2008, Pages 2223-2226

  Guo, Jinghua ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

D. Electronic structure

Indexed keywords

ATOMIC SPECTROSCOPY; CHEMISORPTION; CHLORINE COMPOUNDS; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; HYDROGEN; HYDROGEN STORAGE; MATERIALS PROPERTIES; MOLECULAR SPECTROSCOPY; PHOTONS; PHYSISORPTION; SPECTRUM ANALYSIS; X RAY LITHOGRAPHY; X RAY SCATTERING; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

D. ELECTRONIC STRUCTURE; SOFT-X-RAY SPECTROSCOPY;

ELECTROMAGNETIC WAVES;

CHEMISORPTION; CHLORINE COMPOUNDS; ELECTROMAGNETIC RADIATION; HYDROGEN; LITHOGRAPHY; SCATTERING; SPECTROSCOPY;

EID: 50949121793     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2008.03.033     Document Type: Article

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