X-ray powder diffraction study of ZnGa2Te4

Powder Diffraction

Volumn 17, Issue 1, 2002, Pages 41-43

  Rashmi, ^a   Dhawan, U ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

Chalcogenides; Crystal structure; Defect tetrahedral structure; Powder diffraction data; X ray diffraction; ZnGa2Te4

Indexed keywords

CHALCOGENIDES; POWDER DIFFRACTION;

CRYSTAL STRUCTURE; CRYSTALLIZATION; LATTICE CONSTANTS; X RAY POWDER DIFFRACTION;

ZINC COMPOUNDS;

EID: 0035995866     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1424263     Document Type: Article

References (12)

1. A simplified criterion for the reliability of a powder pattern indexing
2. VI semiconductors: Optical and photoelectric properties, and potential applications (review)
3. 4
4. 4, a defect sphalerite derivative
5. 3 on ZnSe
6. X-ray powder diffraction study of CuIn-SeTe
7. N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing
8. 4 thiogallates
9. VI tellurides