Measuring anisotropy in Young's modulus of copper using microcantilever testing

Journal of Materials Research

Volumn 24, Issue 11, 2009, Pages 3268-3276

  Armstrong, David E J ^a   Wilkinson, Angus J ^a   Roberts, Steve G ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL ASPECT RATIO; ELECTRON BACK-SCATTERED DIFFRACTION; FOCUSED ION BEAM MACHINING; LITERATURE DATA; LONG AXIS; MICRO-CANTILEVERS; POLYCRYSTALLINE COPPER; SINGLE CRYSTAL COPPER; SINGLE GRAINS; TRIANGULAR CROSS-SECTIONS; YOUNG'S MODULUS;

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; COMPOSITE MICROMECHANICS; CRYSTAL ORIENTATION; ELASTIC MODULI; ELASTICITY; NANOCANTILEVERS; SINGLE CRYSTALS;

COPPER;

EID: 70450155388     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2009.0396     Document Type: Article

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