Simultaneous measurement of soft error rate of 90 NM CMOS SRAM and cosmic ray neutron spectra at the summit of Mauna Kea

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 727-728

  Tosaka, Yoshiharu ^a   Takasu, Ryozo ^a   Uemura, Taiki ^a   Ehara, Hideo ^a   Matsuyama, Hideya ^a   Satoh, Shigeo ^a   Kawai, Atsushi ^b   Hayashi, Masahiko ^b  

^a FUJITSU LABORATORIES LTD   (Japan)

^b NATIONAL ASTRONOMICAL OBSERVATORY OF JAPAN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 51549104506     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4559009     Document Type: Conference Paper

References (6)

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4. R. L. Bramblett et al., Nucl. Inst. & Met., vol. 9, pp. 1-12, 1960.
5. R. Takasu et al., IEEE Proc. IRPS, pp. 230-233, 2005.
6. Y. Tosaka et al., IEEE Trans. Nucl, Sci., Vol. 46, pp. 774-780, 1999: Proc. SISPAD, pp. 219-222, 2004.