Critical steps in data analysis for precision Casimir force measurements with semiconducting films

International Journal of Modern Physics A

Volumn 26, Issue 22, 2011, Pages 3900-3909

  Banishev, A A ^a   Chang, Chia Cheng ^a   Mohideen, U ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Casimir effect; Indium Tin Oxide; precision measurements

Indexed keywords

EID: 80052667617     PISSN: 0217751X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217751X11054358     Document Type: Conference Paper

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