A study of the photoconductivity and thermoelectric properties of Sn xSy optical semiconductor thin films deposited by the spray pyrolysis technique

Physica Scripta

Volumn 84, Issue 3, 2011, Pages

  Fadavieslam, M R ^a,b   Shahtahmasebi, N ^a   Rezaee Roknabadi, M ^a   Bagheri Mohagheghi, M M ^b  

^a FERDOWSI UNIVERSITY OF MASHHAD   (Iran)

^b DAMGHAN UNIVERSITY   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

ALCOHOLIC SOLUTIONS; ATOMIC RATIO; ENERGY DISPERSIVE X-RAY; GLASS SUBSTRATES; HELIUM ION; HIGH TEMPERATURE RANGE; OPTICAL GAP; POLYCRYSTALLINE STRUCTURE; PREFERRED ORIENTATIONS; SEMICONDUCTOR THIN FILMS; SPRAY-PYROLYSIS TECHNIQUES; THERMAL ACTIVATION ENERGIES; THERMOELECTRIC PROPERTIES; TIN CHLORIDES; TIN SULFIDE; UV-VIS SPECTROSCOPY;

ACTIVATION ENERGY; CHLORINE COMPOUNDS; CRYSTAL ORIENTATION; HELIUM; LIGHT SENSITIVE MATERIALS; OPTICAL FILMS; PHOTOCONDUCTIVITY; PHOTOELECTRICITY; PHOTOSENSITIVITY; SCANNING ELECTRON MICROSCOPY; SPRAY PYROLYSIS; SUBSTRATES; THERMOELECTRIC EQUIPMENT; THERMOELECTRICITY; THIN FILMS; THIOUREAS; TIN; ULTRAVIOLET SPECTROSCOPY; UREA; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

FILM PREPARATION;

EID: 80052661984     PISSN: 00318949     EISSN: 14024896     Source Type: Journal    
DOI: 10.1088/0031-8949/84/03/035705     Document Type: Article

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