From mean values to distributions of BTI lifetime of deeply scaled FETs through atomistic understanding of the degradation

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2011, Pages 152-153

  Toledano Luque, M ^a,b   Kaczer, B ^a   Franco, J ^a,c   Roussel, Ph J ^a   Grasser, T ^b   Hoffmann, T Y ^a   Groeseneken, G ^a,c  

^a IMEC   (Belgium)

^b UCMadrid ^*  (Austria)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

LIFE-TIME DISTRIBUTION; MEAN VALUES; TIME DEPENDENT;

MESFET DEVICES;

EID: 80052658029     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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