Electrical characterization of hydrothermally grown ZnO annealed in different atmospheres

International Journal of Applied Ceramic Technology

Volumn 8, Issue 5, 2011, Pages 1017-1022

  Quemener, Vincent ^a   Vines, Lasse ^a   Monakhov, Edouard V ^a   Svensson, Bengt G ^a  

^a UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION BAND EDGE; ELECTRICAL CHARACTERIZATION; FREEZE OUT; GAS AMBIENTS; HIGH-TEMPERATURE ANNEALING; HYDROTHERMALLY; OXYGEN-DEFICIENT DEFECTS; RESIDUAL IMPURITIES; SCHOTTKY CONTACTS; SHALLOW DONORS; THERMAL ADMITTANCE SPECTROSCOPY; ZNO; ZNO CRYSTALS;

CRYSTAL IMPURITIES; DEFECTS; ELECTRON MOBILITY; POWER QUALITY; ZINC; ZINC OXIDE;

DEEP LEVEL TRANSIENT SPECTROSCOPY;

EID: 80052648561     PISSN: 1546542X     EISSN: 17447402     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2010.02579.x     Document Type: Article

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