Interactions between interface traps in electron capture/emission processes: Deviation from charge pumping current based on the shockley-read-hall theory

Applied Physics Express

Volumn 4, Issue 9, 2011, Pages

  Tsuchiya, Toshiaki ^a  

^a SHIMANE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE PUMPING; CHARGE PUMPING CURRENT; ELECTRON CAPTURE; ELECTRON CHARGE; GATE PULSE; INTERFACE TRAPS; METAL-OXIDE-SEMICONDUCTOR INTERFACES; SHOCKLEY-READ-HALL THEORIES;

PUMPS;

EID: 80052587620     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.4.094104     Document Type: Article

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