Observation of single interface traps in submicron MOSFET's by charge pumping

IEEE Transactions on Electron Devices

Volumn 43, Issue 6, 1996, Pages 940-945

  Groeseneken, Guido V ^a   De Wolf, Ingrid ^a   Bellens, Rudi ^a   Maes, Herman E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC CURRENTS; HOT CARRIERS; INTERFACES (MATERIALS); SPURIOUS SIGNAL NOISE; TEMPERATURE;

CHARGE PUMPING; HOT CARRIER INJECTION; RANDOM TELEGRAPH SIGNAL NOISE; SINGLE INTERFACE TRAPS;

MOSFET DEVICES;

EID: 0030165986     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.502127     Document Type: Article

References (15)

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