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Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 8, 2011, Pages

Identifying valence band structure of transient phase in VO2 thin film by hard x-ray photoemission

(8) Kanki, Teruo a Takami, Hidefumi a Ueda, Shigenori a,b Hattori, Azusa N a Hattori, Ken c Daimon, Hiroshi c Kobayashi, Keisuke b Tanaka, Hidekazu a

a OSAKA UNIVERSITY (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c NARA INSTITUTE OF SCIENCE AND TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80052480796 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.84.085107 Document Type: Article

Times cited : (22)

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