Optical and magnetic properties of Ni-implanted and post-annealed ZnO thin films

Applied Physics A: Materials Science and Processing

Volumn 104, Issue 2, 2011, Pages 667-675

  Okay, C ^a   Rameev, B Z ^b,c   Guler S ^c   Khaibullin, R I ^b,d   Khakimova, R R ^b,d   Osin, Y N ^b   Akdogan N ^c   Gumarov, A I ^d   Nefedov, A ^e   Zabel, H ^e   Aktas B ^c  

^a MARMARA UNIVERSITY   (Turkey)

^b ZAVOISKY PHYSICAL TECHNICAL INSTITUTE   (Russian Federation)

^c GEBZE TECHNICAL UNIVERSITY   (Turkey)

^d KAZAN FEDERAL UNIVERSITY   (Russian Federation)

^e RUHR UNIVERSITY BOCHUM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DEPENDENCE; ANNEALED SAMPLES; ANNEALING PROCEDURES; ENERGY DISPERSIVE X RAY SPECTROSCOPY; EXPERIMENTAL EVIDENCE; IMPLANTATION DOSE; INTRINSIC FERROMAGNETISM; LOW TEMPERATURES; MAGNETIC PERCOLATION; NARROW RESONANCES; NI ATOMS; NI IONS; NI NANOPARTICLES; OPTICAL MEASUREMENT; OPTICAL TECHNIQUE; ROOM-TEMPERATURE FERROMAGNETISM; SAPPHIRE SUBSTRATES; SEM STUDY; SINGLE-CRYSTALLINE; VIBRATING SAMPLE MAGNETOMETRY; ZNO; ZNO MATRIX; ZNO THIN FILM;

ANNEALING; FERROMAGNETIC RESONANCE; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; METAL ANALYSIS; METALLIC FILMS; NANOMAGNETICS; NANOPARTICLES; OPTICAL DATA PROCESSING; OPTICAL FILMS; RESONANCE; SCANNING ELECTRON MICROSCOPY; SOLVENTS; THIN FILMS; X RAY SPECTROSCOPY; ZINC OXIDE;

FERROMAGNETISM;

EID: 80052448819     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-011-6314-3     Document Type: Article

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