Understanding light trapping by light scattering textured back electrodes in thin film n-i-p -type silicon solar cells

Journal of Applied Physics

Volumn 102, Issue 1, 2007, Pages

  Franken, R H ^a   Stolk, R L ^a   Li, H ^a   Van Der Werf, C H M ^a   Rath, J K ^a   Schropp, R E I ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTROCHEMICAL ELECTRODES; LIGHT SCATTERING; SEMICONDUCTING SILICON; SURFACE PLASMON RESONANCE; THIN FILMS;

ANGULAR RESOLVED SCATTERING INTENSITY; ELECTRODESILICON INTERFACES; LIGHT TRAPPING; MICROCRYSTALLINE MATERIALS;

SOLAR CELLS;

EID: 34547204036     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2751117     Document Type: Article

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