SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 99, Issue 8, 2011, Pages

Nanostructuring graphene on SiC by focused ion beam: Effect of the ion fluence

(8) Prevel B a Benoit, J M a Bardotti, L a Melinon P a Ouerghi, A b Lucot, D b Bourhis, E b Gierak, J b

a UNIVERSITÉ LYON 1 (France)

b CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GRAPHENE; HIGH RESOLUTION; ION DOSE; ION FLUENCES; NANO-STRUCTURING; SPECTROSCOPY MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ELECTRONIC PROPERTIES; FOCUSED ION BEAMS; GRAPHENE; MONOLAYERS; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON CARBIDE;

IONS;

EID: 80052425674 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3628341 Document Type: Article

Times cited : (19)

References (26)

1
- 33947176113
- 10.1126/science.1137201
- K. S. Novoselov, Z. Jiang, Y. Zhang, S. V. Morozov, H. L. Stormer, U. Zeitler, J. C. Maan, G. S. Boebinger, P. Kim, and A. K. Geim, Science 315, 1379 (2008). 10.1126/science.1137201
- (2008) Science , vol.315 , pp. 1379
- Novoselov, K.S.¹ Jiang, Z.² Zhang, Y.³ Morozov, S.V.⁴ Stormer, H.L.⁵ Zeitler, U.⁶ Maan, J.C.⁷ Boebinger, G.S.⁸ Kim, P.⁹ Geim, A.K.¹⁰

2
- 7444220645
- Electric field in atomically thin carbon films
- DOI 10.1126/science.1102896
- K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, Y. Zhang, S. V. Dubonos, I. V. Grigorieva, and A. A Firsov, Science 306, 666 (2004). 10.1126/science.1102896 (Pubitemid 39440910)
- (2004) Science , vol.306 , Issue.5696 , pp. 666-669
- Novoselov, K.S.¹ Geim, A.K.² Morozov, S.V.³ Jiang, D.⁴ Zhang, Y.⁵ Dubonos, S.V.⁶ Grigorieva, I.V.⁷ Firsov, A.A.⁸

3
- 59149091893
- 10.1126/science.1167130
- D. C. Elias, R. R. Nair, T. M. G. Mohiuddin, S. V. Morozov, P. Blake, M. P. Halsall, A. C. Ferrari, D. W. Boukhvalov, M. I. Katsnelson, A. K. Geim, and K. S. Novoselov, Science 323, 610 (2009). 10.1126/science.1167130
- (2009) Science , vol.323 , pp. 610
- Elias, D.C.¹ Nair, R.R.² Mohiuddin, T.M.G.³ Morozov, S.V.⁴ Blake, P.⁵ Halsall, M.P.⁶ Ferrari, A.C.⁷ Boukhvalov, D.W.⁸ Katsnelson, M.I.⁹ Geim, A.K.¹⁰ Novoselov, K.S.¹¹

4
- 27744475163
- Experimental observation of the quantum Hall effect and Berry's phase in graphene
- DOI 10.1038/nature04235, PII N04235
- B. Zhang, Y. W. Tan, H. L. Stormer, and P. Kim, Nature 438, 201 (2005). 10.1038/nature04235 (Pubitemid 41599868)
- (2005) Nature , vol.438 , Issue.7065 , pp. 201-204
- Zhang, Y.¹ Tan, Y.-W.² Stormer, H.L.³ Kim, P.⁴

5
- 34247137175
- 10.1103/PhysRevB.75.153401
- J. O. Sofo, A. S. Chaudhari, and G. D. Barber, Phys. Rev. B 75, 153401 (2007). 10.1103/PhysRevB.75.153401
- (2007) Phys. Rev. B , vol.75 , pp. 153401
- Sofo, J.O.¹ Chaudhari, A.S.² Barber, G.D.³

6
- 0037292788
- 10.1088/0957-4484/14/2/323
- H. W. Li, D. H. Kang, M. G. Blamire, and W. T. S. Huck, Nanotechnology 14, 220 (2003). 10.1088/0957-4484/14/2/323
- (2003) Nanotechnology , vol.14 , pp. 220
- Li, H.W.¹ Kang, D.H.² Blamire, M.G.³ Huck, W.T.S.⁴

7
- 12144287889
- 10.1016/j.apsusc.2003.11.018
- B. Prével, L. Bardotti, S. Fanget, A. Hannour, P. Mélinon, A. Perez, J. Gierak, G. Faini, E. Bourhis, and D. Mailly, Appl. Surf. Sci. 226, 173 (2004). 10.1016/j.apsusc.2003.11.018
- (2004) Appl. Surf. Sci. , vol.226 , pp. 173
- Prével, B.¹ Bardotti, L.² Fanget, S.³ Hannour, A.⁴ Mélinon, P.⁵ Perez, A.⁶ Gierak, J.⁷ Faini, G.⁸ Bourhis, E.⁹ Mailly, D.¹⁰

8
- 77958510677
- 10.1063/1.3497287
- A. Ouerghi, R. Belkhou, M. Marangolo, M. G. Silly, S. El Moussaoui, M. Eddrief, L. Largeau, M. Portail, and F. Sirotti, Appl. Phys. Lett. 97, 161905 (2010). 10.1063/1.3497287
- (2010) Appl. Phys. Lett. , vol.97 , pp. 161905
- Ouerghi, A.¹ Belkhou, R.² Marangolo, M.³ Silly, M.G.⁴ El Moussaoui, S.⁵ Eddrief, M.⁶ Largeau, L.⁷ Portail, M.⁸ Sirotti, F.⁹

9
- 34247551279
- Sub-5 nm FIB direct patterning of nanodevices
- DOI 10.1016/j.mee.2007.01.059, PII S0167931707000305, Proceedings of the 32nd International Conference on Micro- and Nano-Engineering
- J. Gierak, A. Madouri, A. L. Biance, E. Bourhis, G. Patriarche, C. Ulysse, D. Lucot, X. Lafosse, L. Auvray, L. Bruchhaus, and R. Jede, Microelectron. Eng. 84, 779 (2007). 10.1016/j.mee.2007.01.059 (Pubitemid 46678289)
- (2007) Microelectronic Engineering , vol.84 , Issue.5-8 , pp. 779-783
- Gierak, J.¹ Madouri, A.² Biance, A.L.³ Bourhis, E.⁴ Patriarche, G.⁵ Ulysse, C.⁶ Lucot, D.⁷ Lafosse, X.⁸ Auvray, L.⁹ Bruchhaus, L.¹⁰ Jede, R.¹¹

10
- 34047109564
- WSXM: A software for scanning probe microscopy and a tool for nanotechnology
- DOI 10.1063/1.2432410
- I. Horcas, R. Fernandez, J. M. Gomez-Rodriguez, J. Colchero, J. Gomez-Herrero, and A. M. Baro, Rev. Sci. Instrum. 78, 013705 (2007). 10.1063/1.2432410 (Pubitemid 46511822)
- (2007) Review of Scientific Instruments , vol.78 , Issue.1 , pp. 013705
- Horcas, I.¹ Fernandez, R.² Gomez-Rodriguez, J.M.³ Colchero, J.⁴ Gomez-Herrero, J.⁵ Baro, A.M.⁶

11
- 46049088779
- 10.1103/PhysRevB.77.241404
- J. B. Hannon and R. M. Tromp, Phys. Rev. B 77, 241404 (2008). 10.1103/PhysRevB.77.241404
- (2008) Phys. Rev. B , vol.77 , pp. 241404
- Hannon, J.B.¹ Tromp, R.M.²

12
- 34648825700
- Electronic structure of epitaxial graphene layers on SiC: Effect of the substrate
- DOI 10.1103/PhysRevLett.99.126805
- F. Varchon, R. Feng, J. Hass, X. Li, B. NgocNguyen, C. Naud, P. Mallet, J. Y. Veuillen, C. Berger, E. H. Conrad, and L. Magaud, Phys. Rev. Lett. 99, 126805 (2007). 10.1103/PhysRevLett.99.126805 (Pubitemid 47462648)
- (2007) Physical Review Letters , vol.99 , Issue.12 , pp. 126805
- Varchon, F.¹ Feng, R.² Hass, J.³ Li, X.⁴ Nguyen, B.N.⁵ Naud, C.⁶ Mallet, P.⁷ Veuillen, J.-Y.⁸ Berger, C.⁹ Conrad, E.H.¹⁰ Magaud, L.¹¹

13
- 34848891467
- 10.1140/epjst/e2007-00228-2
- A. Cortijo and M. A. H. Vozmediano, Eur. Phys. J. Spec. Top. 148, 83 (2007). 10.1140/epjst/e2007-00228-2
- (2007) Eur. Phys. J. Spec. Top. , vol.148 , pp. 83
- Cortijo, A.¹ Vozmediano, M.A.H.²

14
- 44949217465
- Ion beam nanopatterning in graphite: Characterization of single extended defects
- DOI 10.1088/0957-4484/19/23/235305, PII S0957448408725583
- P. Mélinon, A. Hannour, L. Bardotti, B. Prével, J. Gierak, E. Bourhis, G. Faini, and B. Canut, Nanotechnology 19, 235305 (2008). 10.1088/0957-4484/19/23/235305 (Pubitemid 351813648)
- (2008) Nanotechnology , vol.19 , Issue.23 , pp. 235305
- Melinon, P.¹ Hannour, A.² Bardotti, L.³ Prevel, B.⁴ Gierak, J.⁵ Bourhis, E.⁶ Faini, G.⁷ Canut, B.⁸

15
- 0003412161
- (Pergamon, New York).
- J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Ranges of Ions in Solids (Pergamon, New York, 1985).
- (1985) The Stopping and Ranges of Ions in Solids
- Ziegler, J.F.¹ Biersack, J.P.² Littmark, U.³

16
- 33750459007
- Raman spectrum of graphene and graphene layers
- DOI 10.1103/PhysRevLett.97.187401
- A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, Phys. Rev. Lett. 97, 187401 (2006). 10.1103/PhysRevLett.97.187401 (Pubitemid 44658281)
- (2006) Physical Review Letters , vol.97 , Issue.18 , pp. 187401
- Ferrari, A.C.¹ Meyer, J.C.² Scardaci, V.³ Casiraghi, C.⁴ Lazzeri, M.⁵ Mauri, F.⁶ Piscanec, S.⁷ Jiang, D.⁸ Novoselov, K.S.⁹ Roth, S.¹⁰ Geim, A.K.¹¹

17
- 33847762932
- Spatially resolved raman spectroscopy of single- and few-layer graphene
- DOI 10.1021/nl061702a
- D. Graf, F. Molitor, K. Ensslin, C. Stampfer, A. Jungen, C. Hierold, and L. Wirtz, Nano Lett. 7, 238 (2007). 10.1021/nl061702a (Pubitemid 46383577)
- (2007) Nano Letters , vol.7 , Issue.2 , pp. 238-242
- Graf, D.¹ Molitor, F.² Ensslin, K.³ Stampfer, C.⁴ Jungen, A.⁵ Hierold, C.⁶ Wirtz, L.⁷

18
- 41849142983
- Monitoring dopants by Raman scattering in an electrochemically top-gated graphene transistor
- DOI 10.1038/nnano.2008.67, PII NNANO200867
- A. Das, S. Pisana, B. Chakraborty, S. Piscanec, S. K. Saha, U. V. Waghmare, K. S. Novoselov, H. R. Krishnamurthy, A. K. Geim, A. C. Ferrari, and A. K. Sood, Nat. Nanotechnol. 3, 210 (2008). 10.1038/nnano.2008.67 (Pubitemid 351499403)
- (2008) Nature Nanotechnology , vol.3 , Issue.4 , pp. 210-215
- Das, A.¹ Pisana, S.² Chakraborty, B.³ Piscanec, S.⁴ Saha, S.K.⁵ Waghmare, U.V.⁶ Novoselov, K.S.⁷ Krishnamurthy, H.R.⁸ Geim, A.K.⁹ Ferrari, A.C.¹⁰ Sood, A.K.¹¹

19
- 62949163758
- 10.1016/j.cplett.2009.03.003
- K. S. Subrahmanyam, R. Voggu, A. Govindaraj, and C. N. R. Rao, Chem. Phys. Lett. 472, 96 (2009). 10.1016/j.cplett.2009.03.003
- (2009) Chem. Phys. Lett. , vol.472 , pp. 96
- Subrahmanyam, K.S.¹ Voggu, R.² Govindaraj, A.³ Rao, C.N.R.⁴

20
- 36849013956
- Raman fingerprint of charged impurities in graphene
- DOI 10.1063/1.2818692
- C. Casiraghi, S. Pisana, K. S. Novoselov, A. K. Geim, and A. C. Ferrari, Appl. Phys. Lett. 91, 233108 (2007). 10.1063/1.2818692 (Pubitemid 350234488)
- (2007) Applied Physics Letters , vol.91 , Issue.23 , pp. 233108
- Casiraghi, C.¹ Pisana, S.² Novoselov, K.S.³ Geim, A.K.⁴ Ferrari, A.C.⁵

21
- 41449092432
- 10.1103/PhysRevB.77.115416
- Z. H. Ni, W. Chen, X. F. Fan, J. L. Kuo, T. Yu, A. T. S. Wee, and Z. X. Shen, Phys. Rev. B 77, 115416 (2008). 10.1103/PhysRevB.77.115416
- (2008) Phys. Rev. B , vol.77 , pp. 115416
- Ni, Z.H.¹ Chen, W.² Fan, X.F.³ Kuo, J.L.⁴ Yu, T.⁵ Wee, A.T.S.⁶ Shen, Z.X.⁷

22
- 54049100050
- 10.1103/PhysRevLett.101.156801
- N. Ferralis, R. Maboudian, and C. Carraro, Phys. Rev. Lett. 101, 156801 (2008). 10.1103/PhysRevLett.101.156801
- (2008) Phys. Rev. Lett. , vol.101 , pp. 156801
- Ferralis, N.¹ Maboudian, R.² Carraro, C.³

23
- 44349150390
- Raman spectra of epitaxial graphene on SiC(0001)
- DOI 10.1063/1.2929746
- J. Rhrl, M. Hundhausen, K. V. Emtsev, Th. Seyller, R. Graupner, and L. Ley, Appl. Phys. Lett. 92, 201918 (2008). 10.1063/1.2929746 (Pubitemid 351733884)
- (2008) Applied Physics Letters , vol.92 , Issue.20 , pp. 201918
- Rohrl, J.¹ Hundhausen, M.² Emtsev, K.V.³ Seyller, Th.⁴ Graupner, R.⁵ Ley, L.⁶

24
- 60749112055
- 10.1021/nl0808684
- L. Liu, S. Ryu, M. R. Tomasik, E. Stolyarova, N. Jung, M. S. Hybertsen, M. L. Steigerwald, L. E. Brus, and G. W. Flynn, Nano Lett. 8, 1965 (2008). 10.1021/nl0808684
- (2008) Nano Lett. , vol.8 , pp. 1965
- Liu, L.¹ Ryu, S.² Tomasik, M.R.³ Stolyarova, E.⁴ Jung, N.⁵ Hybertsen, M.S.⁶ Steigerwald, M.L.⁷ Brus, L.E.⁸ Flynn, G.W.⁹

25
- 30344471753
- Fundamental properties of SiC: Crystal structure bonding energy and structure and lattice vibrations
- in, edited by Z. C. Feng (Springer, Berlin Heidelberg).
- J. Dong and A. B. Chen, Fundamental Properties of SiC: Crystal Structure Bonding Energy and Structure and Lattice Vibrations in SiC Power Materials: Devices and Applications, edited by, Z. C. Feng, (Springer, Berlin Heidelberg, 2004).
- (2004) SiC Power Materials: Devices and Applications
- Dong, J.¹ Chen, A.B.²

26
- 77951536860
- 10.1063/1.3318261
- A. V. Krasheninnikov and K. Nordlung, J. Appl. Phys. 107, 071301 (2010). 10.1063/1.3318261
- (2010) J. Appl. Phys. , vol.107 , pp. 071301
- Krasheninnikov, A.V.¹ Nordlung, K.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.