Real-space investigation of electrical double layers. Potential gradient measurement with a nanometer potential probe

Journal of Physical Chemistry C

Volumn 115, Issue 35, 2011, Pages 17384-17391

  Yoon, Young Hwan ^a   Woo, Dae Ha ^b   Shin, Taeho ^a   Chung, Taek Dong ^a   Kang, Heon ^a  

^a Seoul National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AU(1 1 1 ); ELECTRICAL DOUBLE LAYERS; ELECTRODE POTENTIALS; ELECTRODE SURFACES; GAP DISTANCES; INFLECTION POINTS; INSULATOR FILMS; INTERFACIAL POTENTIAL; ISOLATED ELECTRODES; LOCAL SOLUTION; MICROSCOPIC STRUCTURES; NANOMETER GAP; POTENTIAL DISTRIBUTIONS; POTENTIAL DRIFT; POTENTIAL GRADIENTS; POTENTIAL PROBES; POTENTIAL PROFILES; PROBE APEX; REAL-SPACE; SHORT DISTANCES; SMALL AMPLITUDE; TIME-DEPENDENT;

ELECTRIC PROPERTIES; ELECTRON TUNNELING; GRADIENT METHODS;

PROBES;

EID: 80052319555     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp202193t     Document Type: Article

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