Dual-channel microwave Scanning Probe Microscopy for nanotechnology and molecular biology

European Microwave Week 2010, EuMW2010: Connecting the World, Conference Proceedings - European Microwave Conference, EuMC 2010

Volumn , Issue , 2010, Pages 767-770

  Fabiani, Silvia ^a,b,c   Lucesoli, Agnese ^a   Di Donato, Andrea ^a   Mencarelli, Davide ^a   Venanzoni, Giuseppe ^a   Morini, Antonio ^a   Rozzi, Tullio ^a   Farina, Marco ^a  

^a UNIVERSITÀ POLITECNICA DELLE MARCHE   (Italy)

^b LAAS CNRS   (France)

^c UNIVERSITÉ PAUL SABATIER   (France)

Author keywords

Microwave imaging; Microwave Measurement; Nanotechnology; Scanning probe microscopy

Indexed keywords

BROADBAND MEASUREMENTS; DUAL CHANNEL; MICROWAVE IMAGING; MICROWAVE MICROSCOPY; MICROWAVE SCANNING; NEAR-FIELD SCANNING; POSTPROCESSING ALGORITHMS; REFLECTION COEFFICIENTS; SCANNING PROBE MICROSCOPE; SCANNING PROBES; SCANNING TUNNELING MICROSCOPY (STM); WIDE-BAND;

ELECTRONIC EQUIPMENT MANUFACTURE; IMAGING SYSTEMS; MICROWAVE MEASUREMENT; MOLECULAR BIOLOGY; NANOTECHNOLOGY; PROBES; RESONANT CIRCUITS; SCANNING; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

MICROWAVES;

EID: 78650047280     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

1. E. A. Ash and G. Nicholls, "Super-resolution Aperture Scanning Microscope", Nature, vol. 237, pp. 510-512, June 1972.
2. C. P. Vlahacos, R.C. Black, S.M. Anlage, A. Amar and F.C. Wellstood, "Near-Field Scanning Microwave Microscope with 100 m resolution", Appl. Phys. Lett., vol. 69, no. 21, pp.3272, 3274, 28 November 1996.
3. A. Imtiaz, S. M. Anlage, "A novel STM-assisted microwave microscope with capacitance and loss imaging capability", Ultramicroscopy, Vol. 94, no. 3-4, pp. 209-216, April 2003.
4. J. R. Dizon, X. Wang, R. S. Aga, and Judy Z. Wu, "Combining Near-Field Scanning Microwave Microscopy With Transport Measurement for Imaging Current-Obstructing Defects in HTS Films", IEEE Tran. on Appl. Supercond., Vol. 17, no. 2, pp. 3219-3222, June 2007.
5. W. Han, "Scanning Impedance Probe Microscopy", Photonics Spectra, pp.58-59, May 2008.
6. D. Karbassi et al. "Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement", Rev. Sci. Instrum. Vol. 79, no.9, August 2008.
7. M. Tabib-Azar and Y. Wang, "Design and Fabrication of Scanning Near-Field Microwave Probes Compatible With Atomic Force Microscopy to Image Embedded Nanostructures", IEEE Trans. Microwave Theory Tech., vol. 52, no.3, pp. 971-978, March 2004.
8. A. Tselev, S. M. Anlage, Z. Ma and J. Melngailis, "Broadband dielectric microwave microscopy on μm length scales", arxiv.com, 26/01/2010.
9. R Guckenberger et al., "Scanning tunneling microscopy of insulators and biological specimens based on lateral conductivity of ultrathin water films", Science, vol. 266, pp. 1538-1540, December 1994.
10. M. Farina, A. Lucesoli, A. di Donato, D. Mencarelli, L. Maccari, G. Venanzoni, A. Morini and T. Rozzi, "Algorithm for reduction of noise in ultramicroscopy and application to near-field microwave microscopy", IET Electronics Letters. vol. 46, No. 1, Jan. 2010, pp. 50-52.
11. M. Farina and T. Rozzi, "A Short-Open De-Embedding Technique for Method of Moments-based Electromagnetic Analyses", IEEE Trans. Microwave Theory Tech., vol. 49, no. 4, pp. 624-628, April 2001.