Electric field and grain size dependence of Meyer-Neldel energy in C 60 films

Synthetic Metals

Volumn 161, Issue 17-18, 2011, Pages 1987-1990

  Ullah, Mujeeb ^a   Pivrikas, A ^a,b   Fishchuk, I I ^c   Kadashchuk, A ^d,e   Stadler, P ^a   Simbrunner, C ^a   Sariciftci, N S ^a   Sitter, H ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c INSTITUTE FOR NUCLEAR RESEARCH   (Ukraine)

^d MEC   (Belgium)

^e INSTITUTE OF PHYSICS   (Ukraine)

Author keywords

Charge carrier mobility; Charge transport; Film morphology; Grain size; Meyer Neldel rule; Organic field effect transistors

Indexed keywords

CRYSTALLINITIES; FILM MORPHOLOGY; FULLERENE FILMS; GAUSSIAN DENSITY OF STATE; GRAIN SIZE; GRAIN SIZE DEPENDENCE; MEYER-NELDEL RULES; SOURCE-DRAIN VOLTAGE; TEMPERATURE DEPENDENT;

ELECTRIC FIELDS; GRAIN SIZE AND SHAPE; MORPHOLOGY; ORGANIC FIELD EFFECT TRANSISTORS; SEMICONDUCTING ORGANIC COMPOUNDS; TRANSISTORS;

CARRIER MOBILITY;

EID: 80052270869     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2011.07.008     Document Type: Article

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