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Volumn 519, Issue 22, 2011, Pages 7803-7808
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Effects of atomic layer deposited HfO2 compact layer on the performance of dye-sensitized solar cells
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Author keywords
Atomic force microscopy; Atomic layer deposition; Compact layer; Dye sensitized solar cells; Electrochemical impedance spectroscopy; Hafnium oxide
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Indexed keywords
ATOMIC FORCE;
ATOMIC LAYER DEPOSITED;
COMPACT LAYER;
CURRENT VOLTAGE;
DEPOSITION METHODS;
DYE-SENSITIZED SOLAR CELL;
DYE-SENSITIZED SOLAR CELLS;
ELECTROCHEMICAL IMPEDANCE;
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY MEASUREMENTS;
ELECTRON RECOMBINATIONS;
ELECTRONIC QUALITY;
INTERFACIAL RESISTANCES;
LIQUID ELECTROLYTES;
MICROSCOPIC IMAGE;
PHOTOCONVERSION EFFICIENCY;
PHOTOELECTRODE;
PHOTOGENERATED ELECTRONS;
PHOTOVOLTAIC PERFORMANCE;
POROUS NANOPARTICLES;
TIO;
TRANSPARENT CONDUCTING OXIDE;
ULTRA-THIN;
ATOMIC FORCE MICROSCOPY;
ATOMIC LAYER DEPOSITION;
ATOMIC SPECTROSCOPY;
ELECTROCHEMICAL CORROSION;
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;
ELECTROLYTES;
ELECTRONS;
HAFNIUM;
HAFNIUM OXIDES;
LIQUIDS;
NANOSTRUCTURED MATERIALS;
OXIDES;
PASSIVATION;
PHOTOELECTROCHEMICAL CELLS;
SOLAR POWER GENERATION;
TITANIUM DIOXIDE;
SOLAR CELLS;
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EID: 80052129143
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.05.007 Document Type: Article |
Times cited : (55)
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References (31)
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