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Volumn 519, Issue 22, 2011, Pages 7803-7808

Effects of atomic layer deposited HfO2 compact layer on the performance of dye-sensitized solar cells

Author keywords

Atomic force microscopy; Atomic layer deposition; Compact layer; Dye sensitized solar cells; Electrochemical impedance spectroscopy; Hafnium oxide

Indexed keywords

ATOMIC FORCE; ATOMIC LAYER DEPOSITED; COMPACT LAYER; CURRENT VOLTAGE; DEPOSITION METHODS; DYE-SENSITIZED SOLAR CELL; DYE-SENSITIZED SOLAR CELLS; ELECTROCHEMICAL IMPEDANCE; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY MEASUREMENTS; ELECTRON RECOMBINATIONS; ELECTRONIC QUALITY; INTERFACIAL RESISTANCES; LIQUID ELECTROLYTES; MICROSCOPIC IMAGE; PHOTOCONVERSION EFFICIENCY; PHOTOELECTRODE; PHOTOGENERATED ELECTRONS; PHOTOVOLTAIC PERFORMANCE; POROUS NANOPARTICLES; TIO; TRANSPARENT CONDUCTING OXIDE; ULTRA-THIN;

EID: 80052129143     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.05.007     Document Type: Article
Times cited : (55)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.