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Volumn , Issue , 2011, Pages 1116-1119

A resonant cantilever sensor for monitoring airborne nanoparticles

Author keywords

airborne nanoparticles; dielectrophoresis; Resonant cantilever sensor; resonant frequency

Indexed keywords

AIR-BORNE SENSORS; AIRBORNE NANOPARTICLES; CANTILEVER SENSORS; FREQUENCY SHIFT; FUNDAMENTAL RESONANT FREQUENCIES; MASS SENSITIVITY; PIEZO-RESISTIVE; PIEZOELECTRIC STACK ACTUATORS; QUALITY FACTORS; RESONANT CANTILEVER; RESONANT FREQUENCY SHIFT; SELF-SENSING; SENSOR SYSTEMS; STABLE CARBON; STRAIN GAUGE; TEMPERATURE COEFFICIENT;

EID: 80052126955     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TRANSDUCERS.2011.5969233     Document Type: Conference Paper
Times cited : (14)

References (7)
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    • Fabrication and characterization of thermally actuated micromechanical resonators for airborne particle mass sensing: II. Device fabrication and characterization
    • 10pp
    • A. Hajjam, J.C. Wilson, A. Rahafrooz, S. Pourkamali, "Fabrication and characterization of thermally actuated micromechanical resonators for airborne particle mass sensing: II. Device fabrication and characterization", J. Micromech. Microeng. 20, 125019 (10pp), 2010.
    • (2010) J. Micromech. Microeng. , vol.20 , pp. 125019
    • Hajjam, A.1    Wilson, J.C.2    Rahafrooz, A.3    Pourkamali, S.4
  • 3
    • 33745745445 scopus 로고    scopus 로고
    • A femtogram resolution mass sensor platform based on SOI electrostatically driven resonant cantilever. Part II: Sensor calibration and glycerine evaporation rate measurement
    • J. Teva, G. Abadal, F. Torres, J. Verd, F. Pérez-Murano, N. Barniol, "A femtogram resolution mass sensor platform based on SOI electrostatically driven resonant cantilever. Part II: Sensor calibration and glycerine evaporation rate measurement", Ultramicroscopy 106, 808-814, 2006.
    • (2006) Ultramicroscopy , vol.106 , pp. 808-814
    • Teva, J.1    Abadal, G.2    Torres, F.3    Verd, J.4    Pérez-Murano, F.5    Barniol, N.6
  • 5
    • 41149132132 scopus 로고    scopus 로고
    • Silicon cantilever sensor for micro-/nanoscale dimension and force metrology
    • E. Peiner, L. Doering, M. Balke, A. Christ. "Silicon cantilever sensor for micro-/nanoscale dimension and force metrology", Microsys. Technol., 14:441-451, 2008.
    • (2008) Microsys. Technol. , vol.14 , pp. 441-451
    • Peiner, E.1    Doering, L.2    Balke, M.3    Christ, A.4
  • 6
    • 72749092940 scopus 로고    scopus 로고
    • Particle manipulation by miniaturised dielectrophoretic devices
    • F. E. H. Tay, L. Yu, and C. Iliescu, "Particle Manipulation by Miniaturised Dielectrophoretic Devices", Defence Science Journal, Vol. 59, No. 6, pp. 595-604, 2009.
    • (2009) Defence Science Journal , vol.59 , Issue.6 , pp. 595-604
    • Tay, F.E.H.1    Yu, L.2    Iliescu, C.3
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.