Charge carrier injection and transport associated with thermally generated cracks in a 6,13-bis(triisopropylsilylethynyl) pentacene thin-film transistor

Solid-State Electronics

Volumn 63, Issue 1, 2011, Pages 163-166

  Bae, Jin Hyuk ^a,c   Kim, Hyeok ^b   Horowitz, Gilles ^b   Lee, Sin Doo ^a  

^a Seoul National University   (South Korea)

^b UNIVERSITÉ PARIS DIDEROT   (France)

^c Center Microelectronics De Provence Georges Charpak   (France)

Author keywords

Carrier injection; Carrier transport; Crack; Interfacial resistance; Post thermal annealing; TIPS pentacene

Indexed keywords

CARRIER INJECTION; CHANNEL RESISTANCE; CHARGE CARRIER INJECTION; ELECTRICAL PERFORMANCE; INTERFACIAL RESISTANCES; ORGANIC TFTS; PENTACENE FILM; PENTACENE THIN-FILM TRANSISTORS; POST-THERMAL ANNEALING; QUANTITATIVE DESCRIPTION; SOLUTION-PROCESSED; STRUCTURAL ORDERS; THERMAL CRACKS; TIPS-PENTACENE;

CONTACT RESISTANCE; CRACKS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM TRANSISTORS;

CARRIER MOBILITY;

EID: 80051792983     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2011.05.014     Document Type: Article

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