Structural characterization of supported nanocrystalline ZnO thin films prepared by dip-coating

Applied Surface Science

Volumn 257, Issue 23, 2011, Pages 10045-10051

  Casanova, J R ^a   Heredia, E A ^a   Bojorge, C D ^a   Canepa H R ^a   Kellermann, G ^b   Craievich, A F ^c  

^a Centro de Investigaciones en Solidos Buenos Aires   (Argentina)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

GISAXS; Nanostructured thin films; XR; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; FILM THICKNESS; II-VI SEMICONDUCTORS; ISOTHERMAL ANNEALING; METALLIC FILMS; NANOCRYSTALS; OPTICAL FILMS; SOL-GELS; ULTRATHIN FILMS; X RAY DIFFRACTION; X RAY SCATTERING; ZINC OXIDE;

GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; GRAZING INCIDENCE X-RAY DIFFRACTION; ISOCHRONOUS ANNEALING; NANOCRYSTALLINE ZNO; NANOSTRUCTURED THIN FILM; SOL-GEL DIP COATING TECHNIQUE; STRUCTURAL CHARACTERIZATION;

FILM PREPARATION;

EID: 80051787061     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.06.136     Document Type: Article

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