Effect of magnetic film thickness on the spatial resolution of magnetic force microscope tips

Journal of Physics: Conference Series

Volumn 303, Issue 1, 2011, Pages

  Nagano, Katsumasa ^a   Tobari, Kousuke ^a   Ohtake, Mitsuru ^a   Futamoto, Masaaki ^a  

^a CHUO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATED MATERIALS; COBALT; FILM THICKNESS; MAGNETIC DEVICES; MAGNETIC MOMENTS; MAGNETIC THIN FILMS; MAGNETISM; MICROSCOPES; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; X RAY DIFFRACTION;

MAGNETIC FORCE MICROSCOPES; SIGNAL SENSITIVITY; SPATIAL RESOLUTION; TIP RADIUS; VIBRATING SAMPLE MAGNETOMETRY;

THIN FILMS;

EID: 80051702476     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/303/1/012014     Document Type: Conference Paper

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