Electron mobility variations in surface-charged indium tin oxide thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 8, 2009, Pages

  Dasgupta, S ^a   Lukas, M ^a   Dossel K ^a   Kruk, R ^a   Hahn, H ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349605803     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.085425     Document Type: Article

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