Verification of scattering parameter measurements in waveguides up to 325 GHz including highly-reflective devices

Advances in Radio Science

Volumn 9, Issue , 2011, Pages 9-17

  Schrader, T ^a   Kuhlmann, K ^a   Dickhoff, R ^a   Dittmer, J ^a   Hiebel, M ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b ROHDE AND SCHWARZ GMBH AND CO KG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961065138     PISSN: 16849965     EISSN: 16849973     Source Type: Journal    
DOI: 10.5194/ars-9-9-2011     Document Type: Article

References (15)

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