Inter-laboratory comparison of reflection and transmission measurements in WR-06 waveguide (110 GHz to 170 GHz)

75th ARFTG Microwave Measurement Conference: Measurement of Modulated Signals for Communications

Volumn , Issue , 2010, Pages

  Ridler, Nick ^a   Salter, Martin ^a   Goy, Philippe ^b   Caroopen, Sylvain ^b   Watts, James ^c   Clarke, Roland ^d   Lau, Yuenie ^e   Linton, David ^f   Dickie, Raymond ^f   Huggard, Peter ^g   Henry, Manju ^g   Hesler, Jeffrey ^h   Barker, Scott ⁱ   Stanec, Jim ⁱ  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b AB Millimetre ^*  (France)

^c Flann Microwave Ltd   (United Kingdom)

^d UNIVERSITY OF LEEDS   (United Kingdom)

^e OML Inc   (United States)

^f QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

^g RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^h VIRGINIA DIODES INC   (United States)

ⁱ UNIVERSITY OF VIRGINIA   (United States)

Author keywords

Measurement; Millimetre wave measurement; Millimetre wave waveguides; Rectangular waveguides; Waveguides

Indexed keywords

GRAPHICAL FORMS; INTERLABORATORY COMPARISON; METALLIC WAVEGUIDE; MILLIMETRE-WAVE MEASUREMENT; MILLIMETRE-WAVE WAVEGUIDES; REFLECTION AND TRANSMISSION; STATISTICAL SUMMARY;

MICROWAVE MEASUREMENT; RECTANGULAR WAVEGUIDES;

MEASUREMENTS;

EID: 77958170952     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2010.5496330     Document Type: Conference Paper

References (6)

1. MIL-DTL-85/3C, "Waveguides, rigid, rectangular (millimeter wavelength)", October 2005.
2. MIL-DTL-3922/67D, "Flanges, waveguide (contact), round, 4 hole (millimeter)", December 2009.
3. N M Ridler and M J Salter, "An approach to the treatment of uncertainty in complex S-parameter measurements", Metrologia, 39(3):295-302, June 2002.
4. th ARFTG Microwave Measurement Conference, Boulder, CO, USA, December 2000.
5. J L Hesler, A R Kerr, W Grammer and E Wollack, "Recommendations for waveguide interfaces to 1 THz" , 18th International Symposium on Space Terahertz Technology, Pasadena, CA, USA, 21-23 March 2007.
6. ISO 5725 (1994), "Accuracy (trueness and precision) of measurement methods and results" (6 parts), International Organization for Standardization, Geveva, Switzerland.