Understanding the residual waveguide interface variations on millimeter wave calibration

76th ARFTG Microwave Measurement Conference: Millimeter-Wave Measurements and Modeling, ARFTG 2010

Volumn , Issue , 2010, Pages

  Lau, Yuenie ^a  

^a OML Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE WAVEGUIDES; MILLIMETER-WAVE WAVEGUIDES; VECTOR NETWORK ANALYZERS; WAVEGUIDE APERTURES; WAVEGUIDE INTERFACES;

CALIBRATION; ELECTRIC NETWORK ANALYSIS; MICROWAVE MEASUREMENT; MILLIMETER WAVE DEVICES; MILLIMETER WAVES; WAVEGUIDES;

ELECTRIC NETWORK ANALYZERS;

EID: 79951783591     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG76.2010.5700066     Document Type: Conference Paper

References (2)

1. th ARFTG Conference, Boulder, CO.
2. th ARFTG Conference, Honolulu, HI.