Traceability to national standards for S-parameter measurements in waveguide at frequencies from 140 GHz to 220 GHz

76th ARFTG Microwave Measurement Conference: Millimeter-Wave Measurements and Modeling, ARFTG 2010

Volumn , Issue , 2010, Pages

  Ridler, Nick ^a   Clarke, Roland ^b   Salter, Martin ^a   Wilson, Alan ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

Calibration and measurement; Millimeter waves; Traceability to national standards; Vector network analysis; Waveguides

Indexed keywords

DIMENSIONAL MEASUREMENTS; FREQUENCY RANGES; HIGH PRECISION; INTERNATIONAL SYSTEM OF UNITS; MEASUREMENT INSTRUMENTATION; NATIONAL PHYSICAL LABORATORY; NATIONAL STANDARD; PRIMARY REFERENCE STANDARDS; S-PARAMETER MEASUREMENTS; SCATTERING PARAMETER MEASUREMENT; TRACEABILITY TO NATIONAL STANDARDS; UNIVERSITY OF LEEDS; VECTOR NETWORK ANALYSIS; VECTOR NETWORK ANALYZERS; WAVEGUIDE DEVICE;

CALIBRATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK ANALYZERS; INSTRUMENTS; LABORATORIES; METRIC SYSTEM; MICROWAVE MEASUREMENT; MILLIMETER WAVE DEVICES; MILLIMETER WAVES; SCATTERING PARAMETERS; STANDARDS; UNCERTAINTY ANALYSIS; WAVEGUIDES;

MEASUREMENTS;

EID: 79951784143     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG76.2010.5700046     Document Type: Conference Paper

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