Complete characterization of rectangular waveguide measurement standards for vector network analyzer in the range of millimeter and sub-millimeter wave frequencies

76th ARFTG Microwave Measurement Conference: Millimeter-Wave Measurements and Modeling, ARFTG 2010

Volumn , Issue , 2010, Pages

  Horibe, Masahiro ^a   Kishikawa, Ryoko ^a   Shida, Masaaki ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Calibration and measurement standards; Higher order mode; Millimeter waves; Misalignment; S parameter; Traceability to national standards; Waveguide apertures

Indexed keywords

HIGHER ORDER MODE; MEASUREMENT STANDARDS; MISALIGNMENT; S PARAMETERS; TRACEABILITY TO NATIONAL STANDARDS; WAVEGUIDE APERTURES;

ALIGNMENT; CALIBRATION; COMPUTER SIMULATION; ELECTRIC FIELDS; ELECTRIC NETWORK ANALYSIS; MEASUREMENTS; MICROWAVE MEASUREMENT; MILLIMETER WAVE DEVICES; MILLIMETER WAVES; RECTANGULAR WAVEGUIDES; SCATTERING PARAMETERS; SHIMS; STANDARDS; SURFACE ROUGHNESS;

ELECTRIC NETWORK ANALYZERS;

EID: 79951781394     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG76.2010.5700053     Document Type: Conference Paper

References (12)

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