Epitaxial interfaces between crystallographically mismatched materials

Physical Review Letters

Volumn 107, Issue 2, 2011, Pages

  Erwin, Steven C ^a   Gao, Cunxu ^b   Roder, Claudia ^b   Lähnemann, Jonas ^b   Brandt, Oliver ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL INTERFACES; FIRST-PRINCIPLES; HEXAGONAL GAN; INTERFACE PLANES; RESIDUAL STRAINS; TOTAL-ENERGY CALCULATIONS;

CALCULATIONS; EPITAXIAL GROWTH; GALLIUM NITRIDE; LATTICE CONSTANTS;

INTERFACES (MATERIALS);

EID: 79961062122     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.107.026102     Document Type: Article

References (19)

1. E.G. Bauer, B.W. Dodson, D.J. Ehrlich, L.C. Feldman, C.P. Flynn, M.W. Geis, J.P. Harbison, R.J. Matyi, P.S. Peercy, and P.M. Petroff, J. Mater. Res. 5, 852 (1990). JMREEE 0884-2914 10.1557/JMR.1990.0852
2. C.J. Palmstrøm, Annu. Rev. Mater. Sci. ARMSCX 0084-6600 25, 389 (1995). 10.1146/annurev.ms.25.080195.002133
3. J.W. Matthews and A.E. Blakeslee, J. Cryst. Growth JCRGAE 0022-0248 10.1016/S0022-0248(74)80055-2 27, 118 (1974).
4. A.P. Sutton and R.W. Balluffi, Acta Metall. 35, 2177 (1987). AMETAR 0001-6160 10.1016/0001-6160(87)90067-8 (Pubitemid 17654980)
5. A. Trampert, Physica (Amsterdam) 13E, 1119 (2002). PELNFM 1386-9477 10.1016/S1386-9477(02)00317-X (Pubitemid 34648895)
6. O. Brandt, Y.J. Sun, L. Däweritz, and K.H. Ploog, Phys. Rev. B PRBMDO 0163-1829 69, 165326 (2004). 10.1103/PhysRevB.69.165326
7. H.K. Mao, W.A. Bassett, and T. Takahashi, J. Appl. Phys. 38, 272 (1967). JAPIAU 0021-8979 10.1063/1.1708965
8. M. Leszczynski, H. Teisseyre, T. Suski, I. Grzegory, M. Bockowski, J. Jun, S. Porowski, K. Pakula, J.M. Baranowski, and C.T. Foxon, Appl. Phys. Lett. 69, 73 (1996). APPLAB 0003-6951 10.1063/1.118123
9. G. Nolze, V. Geist, R.S. Neumann, and M. Buchheim, Cryst. Res. Technol. 40, 791 (2005). CRTEDF 0232-1300 10.1002/crat.200410434 (Pubitemid 41366202)
10. C.X. Gao, O. Brandt, S.C. Erwin, J. Lähnemann, U. Jahn, B. Jenichen, and H.P. Schönherr, Phys. Rev. B PRBMDO 1098-0121 82, 125415 (2010). 10.1103/PhysRevB.82.125415
11. S.C. Erwin (unpublished).
12. J.P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 77, 3865 (1996). PRLTAO 0031-9007 10.1103/PhysRevLett.77.3865
13. G. Kresse and J. Hafner, Phys. Rev. B PRBMDO 0163-1829 47, 558 (1993). 10.1103/PhysRevB.47.558
14. G. Kresse and J. Furthmüller, Phys. Rev. B PRBMDO 0163-1829 54, 11169 (1996). 10.1103/PhysRevB.54.11169
15. P.A. Stadelmann, JEMS electron microscopy software (Java version 3.5110U2010), CIME-EPFL, Switzerland, 1999-2010.
16. S. Joblot, Y. Cordier, F. Semond, S. Chenot, P. Vénnègues, O. Tottereau, P. Lorenzini, and J. Massies, Superlattices Microstruct. 40, 295 (2006). SUMIEK 0749-6036 10.1016/j.spmi.2006.06.018 (Pubitemid 44873061)
17. X. Ni, M. Wu, J. Lee, X. Li, A.A. Baski, A. Azgür, and H. Morkoç, Appl. Phys. Lett. 95, 111102 (2009). APPLAB 0003-6951 10.1063/1.3225157
18. R. Ravash, J. Blaesing, A. Dadgar, and A. Krost, Appl. Phys. Lett. 97, 142102 (2010). APPLAB 0003-6951 10.1063/1.3492835
19. A. Kutana and S.C. Erwin (unpublished).