Structural comparison of n-type and p-type LaAlO3/SrTiO 3 interfaces

Physical Review Letters

Volumn 107, Issue 3, 2011, Pages

  Yamamoto, Ryosuke ^a   Bell, Christopher ^b   Hikita, Yasuyuki ^b   Hwang, Harold Y ^b,c,d   Nakamura, Hiroyuki ^a   Kimura, Tsuyoshi ^a   Wakabayashi, Yusuke ^a  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC INTERMIXING; BANDBENDING; ELECTRICAL CONDUCTIVITY; P-TYPE; SRTIO; STRUCTURAL COMPARISON; SURFACE X-RAY DIFFRACTION; TIO;

ELECTRIC CONDUCTIVITY; LANTHANUM ALLOYS; STRONTIUM ALLOYS; TITANIUM DIOXIDE; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

STRONTIUM TITANATES;

EID: 79961055836     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.107.036104     Document Type: Article

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