Limiting factors in atomic resolution cryo electron microscopy: No simple tricks

Journal of Structural Biology

Volumn 175, Issue 3, 2011, Pages 253-263

  Zhang, Xing ^a   Hong Zhou, Z ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Atomic resolution; Beam tilt; CryoEM; Defocus gradient; Dynamic scattering

Indexed keywords

CRYOELECTRON MICROSCOPY; ELECTRON; ELECTRON BEAM; ELECTRON MICROSCOPY; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; MAGNETIC FIELD; PRIORITY JOURNAL; REVIEW; TILTING;

CRYOELECTRON MICROSCOPY;

EID: 79960907297     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2011.05.004     Document Type: Review

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