Confession session: Learning from others mistakes

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2011, Pages 1149-1162

  Abshire, P ^a   Bermak, A ^b   Berner, R ^c   Cauwenberghs, G ^d   Chen, S ^e   Christen, J B ^f   Constandinou, T ^g   Culurciello, E ^h   Dandin, M ^a   Datta, T ^a   Delbruck, T ^c   Dudek, P ⁱ   Eftekhar, A ^g   Etienne Cummings, R ^j   Indiveri, G ^c   Law, M K ^b   Linares Barranco, B ^k   Tapson, J ^l   Tang, W ^h   Zhai, Y ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^c UNIVERSITY OF ZURICH   (Switzerland)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^f ARIZONA STATE UNIVERSITY   (United States)

^g IMPERIAL COLLEGE LONDON   (United Kingdom)

^h YALE UNIVERSITY   (United States)

ⁱ UNIVERSITY OF MANCHESTER   (United Kingdom)

^j JOHNS HOPKINS UNIVERSITY   (United States)

^k UNIVERSITY OF SEVILLE   (Spain)

^l UNIVERSITY OF CAPE TOWN   (South Africa)

more..

Author keywords

[No Author keywords available]

Indexed keywords

PHYSICAL REALITY; SIMULATION TOOL; TECHNICAL CHALLENGES;

MODELS;

ERRORS;

EID: 79960882910     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2011.5937774     Document Type: Conference Paper

References (16)

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