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Applied Physics Letters

Volumn 99, Issue 1, 2011, Pages

Molecular beam epitaxy and characterization of thin Bi2Se 3 films on Al2O3 (110)

(4) Tabor, Phillip a Keenan, Cameron a Urazdhin, Sergei a Lederman, David a

a WEST VIRGINIA UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITIES; FILM SURFACES; FLUX RATIO; INSULATOR FILMS; NON-CONDUCTING SUBSTRATES; OPTICAL ACCESS; SUBSTRATE TEMPERATURE; SURFACE KINETICS;

CARRIER CONCENTRATION; DESORPTION; ELECTRONIC PROPERTIES; EPITAXIAL FILMS; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; SEMICONDUCTING SELENIUM COMPOUNDS; STOICHIOMETRY; SUBSTRATES;

CONDUCTIVE FILMS;

EID: 79960501851 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3609326 Document Type: Article

Times cited : (51)

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