Permittivity measurements at microwave frequencies using epsilon-near-zero (ENZ) tunnel structure

IEEE Transactions on Microwave Theory and Techniques

Volumn 59, Issue 7, 2011, Pages 1863-1868

  Lobato Morales, Humberto ^a   Murthy, D V B ^a   Corona Chávez, Alonso ^a   Olvera Cervantes, José Luis ^a   Martínez Brito, Juan ^b   Guerrero Ojeda, Luis Gerardo ^b  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

^b UNIVERSIDAD DE LAS AMÉRICAS PUEBLA   (Mexico)

Author keywords

Cavity perturbation methods; epsilon near zero (ENZ); permittivity measurements; substrate integrated waveguide (SIW)

Indexed keywords

CAVITY PERTURBATION METHOD; CAVITY PERTURBATION TECHNIQUE; DIELECTRIC PERMITTIVITIES; EPSILON-NEAR-ZERO (ENZ); HIGH SENSITIVITY; SIMULATIONS AND MEASUREMENTS; STANDARD VALUES; SUBSTRATE INTEGRATED WAVEGUIDE TECHNOLOGIES; TUNNEL STRUCTURES;

DIELECTRIC MATERIALS; MICROWAVE CIRCUITS; PERMITTIVITY; PERMITTIVITY MEASUREMENT; PERTURBATION TECHNIQUES; SENSITIVITY ANALYSIS;

SUBSTRATE INTEGRATED WAVEGUIDES;

EID: 79960404096     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2011.2132141     Document Type: Article

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