Measurement of complex dielectric permittivity of partially inserted samples in a cavity perturbation technique

Review of Scientific Instruments

Volumn 67, Issue 1, 1996, Pages 279-282

  Subramanian, V ^a   Sivasubramanian, V ^a   Murthy, V R K ^a   Sobhanadri, J ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038848272     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146548     Document Type: Article

References (14)

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