Experimental dielectric sensing of materials using Epsilon-Near-Zero tunnel in SIW technology

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2010, Pages 1644-1647

  Lobato Morales, Hurnberto ^a   Corona Chavez, Alonso ^a   Murthy, D V B ^a   Martinez Brito, Juan ^b   Guerrero Ojeda, Luis G ^b  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

^b UNIVERSIDAD DE LAS AMÉRICAS PUEBLA   (Mexico)

Author keywords

Epsilon Near Zero; Microwave measurements; Permittivity measurements; Plasmonic structure; Substrate integrated waveguide

Indexed keywords

DIELECTRIC PERMITTIVITIES; DIELECTRIC SENSING; EPSILON-NEAR-ZERO; HIGH SENSITIVITY; LOW COSTS; LOW PROFILE; MATERIAL ANALYSIS; PLASMONIC STRUCTURES; STANDARD VALUES; SUBSTRATE INTEGRATED WAVEGUIDE TECHNOLOGIES;

DIELECTRIC MATERIALS; MICROWAVE CIRCUITS; MICROWAVE MEASUREMENT; MICROWAVES; PERMITTIVITY; PERMITTIVITY MEASUREMENT; PLASMONS;

SUBSTRATE INTEGRATED WAVEGUIDES;

EID: 77957785519     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2010.5515749     Document Type: Conference Paper

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