Complex permittivity measurements using cavity perturbation technique with substrate integrated waveguide cavities

Review of Scientific Instruments

Volumn 81, Issue 6, 2010, Pages

  Lobato Morales, Humberto ^a   Corona Chávez, Alonso ^a   Murthy, D V B ^a   Olvera Cervantes, Joś L ^a  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CAVITY PERTURBATION TECHNIQUE; COMPLEX PERMITTIVITY; COMPLEX PERMITTIVITY MEASUREMENT; DIELECTRIC CHARACTERISTICS; DIELECTRIC PERMITTIVITIES; PLANAR CAVITIES; SIMULATIONS AND MEASUREMENTS; THEORETICAL FORMULA;

DIELECTRIC MATERIALS; MICROWAVE DEVICES; PERMITTIVITY; PERMITTIVITY MEASUREMENT; SUBSTRATE INTEGRATED WAVEGUIDES; SUBSTRATES;

PERTURBATION TECHNIQUES;

ALGORITHM; ARTICLE; COMPUTER SIMULATION; MATERIALS TESTING; METHODOLOGY; THEORETICAL MODEL; VALIDATION STUDY;

ALGORITHMS; COMPUTER SIMULATION; MATERIALS TESTING; MODELS, THEORETICAL;

EID: 77954183159     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3442512     Document Type: Article

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