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Journal of Applied Physics

Volumn 109, Issue 12, 2011, Pages

Structural, magnetic and electrical properties of ferromagnetic/ ferroelectric multilayers

(6) Sirena, M a,c Kaul, E a,c Pedreros, M B b Rodriguez, C A b Guimpel, J a,c Steren, L B a,c

a CENTRO ATÓMICO BARILOCHE (Argentina)

b UNIVERSITY OF CONCEPCIÓN (Chile)

c CONICET ^* (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; BIAXIAL STRAINS; CONDUCTION MECHANISM; CONDUCTIVE ATOMIC FORCE MICROSCOPY; DC SPUTTERING; FERROELECTRIC LAYERS; FERROELECTRIC MULTILAYER; FERROELECTRIC THICKNESS; FERROMAGNETIC LAYERS; MAGNETIC AND ELECTRICAL PROPERTIES; MAGNETIC DEAD LAYERS; MAGNETIZATION MEASUREMENTS; MULTIFERROICS; TEXTURED GROWTH; TIO; TRANSPORT TUNNELING; UNIT CELLS;

ATOMIC FORCE MICROSCOPY; BARIUM; ELECTRIC PROPERTIES; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC MULTILAYERS; MAGNETIZATION; MANGANESE OXIDE; TUNNEL JUNCTIONS; X RAY DIFFRACTION;

FERROELECTRICITY;

EID: 79960167339 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3598134 Document Type: Article

Times cited : (14)

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