Oxidation dynamics of epitaxial rubrene ultrathin films

Chemistry of Materials

Volumn 23, Issue 13, 2011, Pages 3246-3253

  Fumagalli, Enrico ^a   Raimondo, Luisa ^a   Silvestri, Leonardo ^a,b   Moret, Massimo ^a   Sassella, Adele ^a   Campione, Marcello ^a  

^a Department of Materials Science ^*  (Italy)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

epitaxy; organic electronics; surface modification; Thin films

Indexed keywords

AMBIENT CONDITIONS; CRYSTALLINE DOMAINS; DEGREE OF CRYSTALLINITY; ELECTRONIC DEVICE; KELVIN PROBE; MOLECULAR DIPOLE; ORGANIC ELECTRONICS; ORGANIC EPITAXY; ORGANIC MOLECULAR BEAM EPITAXY; ORGANIC SEMICONDUCTING MATERIALS; OXIDATION DYNAMICS; OXIDATION PROCESS; PHASE CONTRASTS; RUBRENE THIN FILMS; RUBRENES; SCANNING PROBE TECHNIQUES; STRUCTURAL DATA; TETRACENE; THEORETICAL CALCULATIONS; TWO-MOLECULAR LAYERS;

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; DIELECTRIC PROPERTIES; EPITAXIAL FILMS; EPITAXIAL GROWTH; FILMS; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR ORIENTATION; OXIDATION; PROBES; SEMICONDUCTING FILMS; TRANSPORT PROPERTIES;

ULTRATHIN FILMS;

EID: 79959937285     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm201230j     Document Type: Article

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