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Volumn 86, Issue 11, 2005, Pages 1-3

Enhanced Raman scattering for temperature measurement of a laser-heated atomic force microscope tip

Author keywords

[No Author keywords available]

Indexed keywords

ENHANCED RAMAN SCATTERING; PROBE LASER WAVELENGTH; RAMAN STOKES; THERMOMECHANICAL RECORDING SYSTEMS;

EID: 17944379080     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1885178     Document Type: Article
Times cited : (42)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.