Nonlinear behavior during semi-quantitative analysis of thin organic layers by laser desorption mass spectrometry

Rapid Communications in Mass Spectrometry

Volumn 25, Issue 15, 2011, Pages 2196-2200

  Mavrinskaya, Natalia ^a   Räder, Hans Joachim ^a   Müllen, Klaus ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DESORPTION; EFFICIENCY; FILM THICKNESS; LASER BEAMS; MASS SPECTROMETRY; MOLECULES; ORGANIC FIELD EFFECT TRANSISTORS; ORGANIC LASERS; THICKNESS MEASUREMENT; THIN FILMS;

LASER DESORPTION MASS SPECTROMETRY; LAYER THICKNESS; NONLINEAR BEHAVIOURS; ORGANIC ELECTRONICS AND OPTOELECTRONICS; ORGANIC THIN-FILMS; SEMI-QUANTITATIVE ANALYSIS; SIGNAL INTENSITIES; SUB-MONOLAYERS; SURFACE COVERAGES; THIN ORGANIC LAYERS;

ATOMIC FORCE MICROSCOPY;

EID: 79959744353     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.5102     Document Type: Article

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