Matrix effects on secondary ion emission from a room-temperature ionic liquid, 1-ethyl-3-methylimidazolium bis[trifluoromethanesulfonyl]imide

Journal of Chemical Physics

Volumn 130, Issue 24, 2009, Pages

  Souda, Ryutaro ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND EFFECT; COUNTERION; CRYSTALLINE FILMS; ELECTROSTATIC INTERACTIONS; HIGHER EFFICIENCY; INTERMOLECULAR INTERACTIONS; IONIZATION MECHANISMS; MATRIX EFFECTS; MONOLAYER COVERAGE; MORPHOLOGICAL CHANGES; NI ATOMS; NONIONIC; POLAR MOLECULES; POROUS STRUCTURES; QUASIMOLECULE; ROOM TEMPERATURE IONIC LIQUIDS; SECONDARY ION EMISSION; SECONDARY ION YIELD; SPACER LAYER; TEMPERATURE EVOLUTION; TEMPERATURE RANGE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

IONIC LIQUIDS; MOLECULES; MONOLAYERS; NEGATIVE IONS; NICKEL; PHASE TRANSITIONS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

IONIZATION OF LIQUIDS;

1 ETHYL 3 METHYLIMIDAZOLIUM; 1 ETHYL 3 METHYLIMIDAZOLIUM BIS(TRIFLUOROMETHANESULFONYL)IMIDE; 1-ETHYL-3-METHYLIMIDAZOLIUM; 1-ETHYL-3-METHYLIMIDAZOLIUM BIS(TRIFLUOROMETHANESULFONYL)IMIDE; IMIDAZOLE DERIVATIVE; ION; IONIC LIQUID; NICKEL; SULFONAMIDE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON; MASS SPECTROMETRY; PHASE TRANSITION; TEMPERATURE;

CRYSTALLIZATION; ELECTRONS; IMIDAZOLES; IONIC LIQUIDS; IONS; NICKEL; PHASE TRANSITION; SPECTROMETRY, MASS, SECONDARY ION; SULFONAMIDES; TEMPERATURE;

EID: 67650469388     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3159394     Document Type: Article

References (30)

1. K. L. Busch, B. H. Hsu, Y. -X. Xie, and R. G. Cooks, Anal. Chem. 0003-2700 55, 1157 (1983). 10.1021/ac00258a040
2. K. J. Wu and R. W. Odom, Anal. Chem. 0003-2700 68, 873 (1996). 10.1021/ac950717i
3. A. D. Appelhans and J. E. Delmore, Anal. Chem. 0003-2700 61, 1087 (1989). 10.1021/ac00185a009
4. N. Davies, D. E. Weibel, P. Blenkinsopp, N. Lockyer, R. Hill, and J. C. Vickerman, Appl. Surf. Sci. 0169-4332 203-204, 223 (2003). 10.1016/S0169- 4332(02)00631-1
5. A. Delcorte, N. Medard, and P. Bertrand, Anal. Chem. 0003-2700 74, 4968 (2002). 10.1021/ac020125h
6. L. Adriaensen, F. Vangaever, and R. Gijbels, Anal. Chem. 0003-2700 76, 6777 (2004). 10.1021/ac049108d
7. A. Marcus and N. Winograd, Anal. Chem. 0003-2700 78, 141 (2006). 10.1021/ac0513921
8. R. Souda, Phys. Rev. Lett. 0031-9007 93, 235502 (2004). 10.1103/PhysRevLett.93.235502
9. R. Souda, J. Chem. Phys. 0021-9606 129, 124707 (2008). 10.1063/1.2980041
10. R. Souda, J. Phys. Chem. B 1089-5647 112, 12439 (2008). 10.1021/jp804781j
11. R. Souda, J. Phys. Chem. B 1089-5647 112, 2649 (2008). 10.1021/jp710263m
12. P. Williams, Surf. Sci. 0039-6028 90, 588 (1979). 10.1016/0039-6028(79) 90363-7
13. A. Wucher, Appl. Surf. Sci. 0169-4332 255, 1194 (2008). 10.1016/j.apsusc.2008.05.252
14. J. D. Holbrey and K. R. Seddon, Clean Prod. Process. 1, 233 (1999). 1435-2974
15. M. J. Earle, J. M. S. S. Esperanca, M. A. Gilea, J. N. C. Lopes, L. P. N. Rebelo, J. W. Magee, K. R. Seddon, and J. A. Widegren, Nature (London) 0028-0836 439, 831 (2006). 10.1038/nature04451
16. J. Günster, O. Höfft, S. Krischok, and R. Souda, Surf. Sci. 0039-6028 602, 3403 (2008). 10.1016/j.susc.2008.09.018
17. R. Souda, J. Phys. Chem. B 1089-5647 112, 15349 (2008). 10.1021/jp805120m
18. R. Souda, H. Kawanowa, M. Kondo, and Y. Gotoh, J. Chem. Phys. 0021-9606 120, 5723 (2004). 10.1063/1.1650292
19. R. Souda, J. Chem. Phys. 0021-9606 111, 10652 (1999). 10.1063/1.480418
20. E. F. Smith, F. J. M. Rutten, I. J. Villar-Garcia, D. Briggs, and P. Licence, Langmuir 0743-7463 22, 9386 (2006). 10.1021/la061248q
21. S. U. Lee, J. Jung, and Y. K. Han, Chem. Phys. Lett. 0009-2614 406, 332 (2005). 10.1016/j.cplett.2005.02.109
22. A. Choudhury, N. Winterton, A. Steiner, A. I. Cooper, and K. A. Johnson, Cryst. Eng. Comm. 1466-8033 8, 742 (2006). 10.1039/b609598d
23. R. Souda (unpublished).
24. Y. U. Paulechka, G. J. Kabo, and V. N. Emel'yanenko, J. Phys. Chem. B 1089-5647 112, 15708 (2008). 10.1021/jp804607n
25. K. Fujii, Y. Soejima, Y. Kyoshoin, S. Fukuda, R. Kanzaki, Y. Umebayashi, T. Yamaguchi, S. Ishiguro, and T. Takamuku, J. Phys. Chem. B 1089-5647 112, 4329 (2008). 10.1021/jp7105499
26. R. Souda, H. Kawanowa, M. Kondo, and Y. Gotoh, J. Chem. Phys. 0021-9606 119, 6194 (2003). 10.1063/1.1602055
27. S. Folsch, U. Barjenbrush, and M. Henzler, Thin Solid Films 0040-6090 172, 123 (1989). 10.1016/0040-6090(89)90123-5
28. R. Brako and D. M. Newns, Surf. Sci. 0039-6028 108, 253 (1981). 10.1016/0039-6028(81)90448-9
29. E. R. Behringer, D. R. Andersson, and B. H. Cooper, Phys. Rev. B 0163-1829 54, 14765 (1996). 10.1103/PhysRevB.54.14765
30. R. Souda, K. Yamamoto, B. Tilley, W. Hayami, T. Aizawa, and Y. Ishizawa, Phys. Rev. B 0163-1829 50, 18489 (1994). 10.1103/PhysRevB.50.18489