-
1
-
-
0003860827
-
-
2nd ed., Chapman & Hall, New York
-
Tummala, R. R., Rymaszewski, E. J., and Klopfenstein, A. G., 1997, Microelectronics Packaging Handbook, 2nd ed., Chapman & Hall, New York.
-
(1997)
Microelectronics Packaging Handbook
-
-
Tummala, R.R.1
Rymaszewski, E.J.2
Klopfenstein, A.G.3
-
2
-
-
0000474427
-
Wafer-level vacuum packaging for MEMS
-
Gooch, R., Schimert, T., McCardel, W., Ritchey, B., Gilmour, D., and Koziarz, W., 1999, "Wafer-Level Vacuum Packaging for MEMS," J. Vac. Sci. Technol. A, 17(4), pp. 2295-2299.
-
(1999)
J. Vac. Sci. Technol. A
, vol.17
, Issue.4
, pp. 2295-2299
-
-
Gooch, R.1
Schimert, T.2
McCardel, W.3
Ritchey, B.4
Gilmour, D.5
Koziarz, W.6
-
3
-
-
0141884179
-
Packaging of optical MEMS devices
-
Low, Y. L., Scotti, R. E., Ramsey, D. A., Bolle, C. A., O'Neill, S. P., and Nguyen, K. C., 2003, "Packaging of Optical MEMS Devices," ASME J. Electron. Packag., 125(3), pp. 325-328.
-
(2003)
ASME J. Electron. Packag.
, vol.125
, Issue.3
, pp. 325-328
-
-
Low, Y.L.1
Scotti, R.E.2
Ramsey, D.A.3
Bolle, C.A.4
O'Neill, S.P.5
Nguyen, K.C.6
-
4
-
-
0026983574
-
Reliability evaluation of high pin count hermetic ceramic IC packages for space applications
-
Barrett, J. J., Hayes, T. F., Doyle, R., Mathuna, S. C. O., Yamada, T., and Boetti, A., 1992, "Reliability Evaluation of High Pin Count Hermetic Ceramic IC Packages for Space Applications," IEEE Trans. Compon. Hybrids Manuf. Technol., 15(6), pp. 1093-1104.
-
(1992)
IEEE Trans. Compon. Hybrids Manuf. Technol.
, vol.15
, Issue.6
, pp. 1093-1104
-
-
Barrett, J.J.1
Hayes, T.F.2
Doyle, R.3
Mathuna, S.C.O.4
Yamada, T.5
Boetti, A.6
-
5
-
-
0033747819
-
Lead-free solders in microelectronics
-
Abtew, M., and Selvaduray, G., 2000, "Lead-Free Solders in Microelectronics," Mat. Sci. Eng. R., 27(5-6), pp. 95-141.
-
(2000)
Mat. Sci. Eng.R.
, vol.27
, Issue.5-6
, pp. 95-141
-
-
Abtew, M.1
Selvaduray, G.2
-
6
-
-
0035047957
-
Advances in lead-free electronics soldering
-
DOI 10.1016/S1359-0286(00)00036-X, PII S135902860000036X
-
Suganuma, K., 2001, "Advances in Lead-Free Electronics Soldering," Curr. Opin. Solid State Mater. Sci., 5(1), pp. 55-64. (Pubitemid 32320603)
-
(2001)
Current Opinion in Solid State and Materials Science
, vol.5
, Issue.1
, pp. 55-64
-
-
Suganuma, K.1
-
7
-
-
0018482659
-
Properties of die bond alloys relating to thermal fatigue
-
Olsen, D. R., and Berg, H. M., 1979, "Properties of Die Bond Alloys Relating to Thermal Fatigue," IEEE Trans. Compon. Hybrids Manuf. Technol., 2(2), pp. 257-263.
-
(1979)
IEEE Trans. Compon. Hybrids Manuf. Technol.
, vol.2
, Issue.2
, pp. 257-263
-
-
Olsen, D.R.1
Berg, H.M.2
-
8
-
-
0003752969
-
-
Van Nostrand, New York
-
Frear, D. R., Burchett, S. N., Morgan, H. S., and Lau, J. H., 1994, The Mechanics of Solder Alloy Interconnects, Van Nostrand, New York.
-
(1994)
The Mechanics of Solder Alloy Interconnects
-
-
Frear, D.R.1
Burchett, S.N.2
Morgan, H.S.3
Lau, J.H.4
-
9
-
-
3242740944
-
Strong, high-yield and low-temperature thermocompression silicon wafer-level bonding with gold
-
Taklo, M. M. V., Storås, P., Schjølberg-Henriksen, K., Hasting, H. K., and Jakobsen, H., 2004, "Strong, High-Yield and Low-Temperature Thermocompression Silicon Wafer-Level Bonding with Gold," J. Micromech. Microeng., 14(7), pp. 884-890.
-
(2004)
J. Micromech. Microeng.
, vol.14
, Issue.7
, pp. 884-890
-
-
Taklo, M.M.V.1
Storas, P.2
Schjølberg-Henriksen, K.3
Hasting, H.K.4
Jakobsen, H.5
-
10
-
-
0036906121
-
Fabrication of wafer-level thermocompression bonds
-
Tsau, C. H., Spearing, S. M., and Schmidt, M. A., 2002, "Fabrication of Wafer-Level Thermocompression Bonds," J. Microelectromech. Syst., 11(6), pp. 641-647.
-
(2002)
J. Microelectromech. Syst.
, vol.11
, Issue.6
, pp. 641-647
-
-
Tsau, C.H.1
Spearing, S.M.2
Schmidt, M.A.3
-
11
-
-
28044463155
-
Low-temperature silicon wafer-scale thermocompression bonding using electroplated gold layers in hermetic packaging
-
Park, G. S., Kim, Y. K., Pak, K. K., Kim, J. S., Lee, J. H., and Ju, B. K., 2005, "Low-Temperature Silicon Wafer-Scale Thermocompression Bonding Using Electroplated Gold Layers in Hermetic Packaging," Electrochem. Solid-State Lett., 8(12), pp. G330-G332.
-
(2005)
Electrochem. Solid-State Lett.
, vol.8
, Issue.12
-
-
Park, G.S.1
Kim, Y.K.2
Pak, K.K.3
Kim, J.S.4
Lee, J.H.5
Ju, B.K.6
-
12
-
-
33846097185
-
Design and construction of a compact vacuum furnace for scientific research
-
Lee, C. C., Wang, D. T., and Choi, W. S., 2006, "Design and Construction of a Compact Vacuum Furnace for Scientific Research," Rev. Sci. Instrum., 77(12), p. 125104.
-
(2006)
Rev. Sci. Instrum.
, vol.77
, Issue.12
, pp. 125104
-
-
Lee, C.C.1
Wang, D.T.2
Choi, W.S.3
-
13
-
-
0002552903
-
Solder attachment reliability, accelerated testing, and results evaluation
-
J. H. Lau, ed., Van Nostrand, New York
-
Engelmaier, W., 1991, "Solder Attachment Reliability, Accelerated Testing, and Results Evaluation," in Solder Joint Reliability Theory and Applications, J. H. Lau, ed., Van Nostrand, New York, pp. 545-587.
-
(1991)
Solder Joint Reliability Theory and Applications
, pp. 545-587
-
-
Engelmaier, W.1
-
14
-
-
35348888344
-
Are intermetallics in solder joints really brittle?
-
DOI 10.1109/ECTC.2007.373866, 4249952, Proceedings - 57th Electronic Components and Technology Conference 2007, ECTC '07
-
Lee, C. C., Wang, P. J., and Kim, J. S., 2007, "Are Intermetallics in Solder Joints Really Brittle?," Proceedings of the 57th IEEE Electronic Components and Technology Conference, Reno, NV, May-June 2007, pp. 648-652. (Pubitemid 47577099)
-
(2007)
Proceedings - Electronic Components and Technology Conference
, pp. 648-652
-
-
Lee, C.C.1
Wang, P.J.2
Kim, J.S.3
|